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Company Profile

SemiMap Scientific Instruments GmbH develops measurement systems to evaluate electrical properties of semi-insulating compound semiconductor substrates. GaAs, InP, SiC, GaN and CdTe wafers are chearacterized by SemiMap systems with respect to resistivity, mobility and carrier concentration.

The non-destrucive contactless capacitive measurement technique requires no sample preparation and generates full wafer resistivity topograms revealing lateral variations as small as 1% with high lateral resolution.

Worldwide Representation

Europe US and East Asia Japan

SemiMap Scientific Instruments GmbH

Tullastr. 67

79108 Freiburg

Germany

Phone: 0049 (0) 761 55 77 878

Fax:    0049 (0) 761 55 77 879

info@semimap.de

www.semimap.de

Hologenix, Inc.

5932 Bolsa Avenue, Suite 104

Huntington Beach, CA 92649

USA

Phone: (714) 903-5999

Fax:    (714) 903-5959

sales@hologenix.com

www.hologenix.com

Moritani & Co., LTD., Satoshi Kobayashi

1-4-22 Yaesu, Chuo-Ku

Tokyo 103-8680

Japan

Phone: 81-(0)3-3278-6163

Fax:    81-(0)3-3278-6021

kobayashi.satoshi@moritani.co.jp

http://sales.moritani.co.jp

 
IF you have questions or comments, please send your E-mail to: info@semimap.de 
Last modification: 04/01/13