Contactless evaluation of semi-insulating GaAs wafer resistivity using the time-dependent charge measurement
R. Stibal, J. Windscheif and W. Jantz, Semicond. Sci. Technol. 6 (1991) 955

Contactless resistivity mapping of semi-insulating substrates
W. Jantz and R. Stibal, III-Vs Review 6 (1993) 382

Quality assessment of LEC grown semi-insulating GaAs substrates
W. Jantz, dgkk Mitteilungsblatt 54 (1991) 19

Global standardization of compound semiconductor test methods
W. Jantz, Proc. DRIP- Proceed. 7th Int. Conf. on Defect Recognition and Image Processing in Semiconductors,
DRIP VII Inst. Conf. Ser. No. 160 (1997) 245

Nondestructive high resolution resistivity topography of semi-insulating GaAs and InP substrates
W. Jantz, R. Stibal, J. Windscheif, F. Mosel and G. Müller, Proc. 7th Conf on Semi-insulating Materials,
Ixtapa Mexico, 1993 IOP Publishing Ltd., p. 171

Topographic Electrical Characterization of Semi-Insulating GaAs, InP and SiC Substrates
R. Stibal, S. Müller and W. Jantz, Proc. CS-MAX, San Jose 2002 [PDF]

Nondestructive Topographic Resistivity Evaluation Of Semiinsulating SiC Substrates
R. Stibal, S. Müller, W. Jantz, G. Pozina, B. Magnusson and A.Ellison, Phys. stat. sol. c3 (2003) 1013 [PDF]

Variation of material parameters along the growth direction of LEC grown GaAs ingots
W. Jantz, R. Stibal, W. Windscheif, J. Wagner,  Applied Surface Science 50 (1991) 480

Contactless mapping of mesoscopic resistivity variations in semi-insulating substrates
R. Stibal, M. Wickert, P. Hiesinger, W. Jantz, Materials Science Engineering B66 (1999) 21

High resolution EL2 and resistivity topography of SI GaAs wafers
M. Wickert, R. Stibal, P. Hiesinger, W. Jantz, J. Wagner, M. Jurisch, U.Kretzer and B.Weinert,
Proc. SIMC-X, IEEE Publishers (1999) 21

Contactless Electron Mobility Evaluation of Semi-Insulating GaAs and InP Wafers
R. Stibal, U. Kretzer and W. Jantz, Digest of GaAs MANTECH, San Diego (2002) 75 [PDF]